发明名称 BACKING PAD, PRECISE FLATTENING METHOD THEREOF AND POLISHING METHOD THEREOF FOR SEMICONDUCTOR WAFER
摘要 PURPOSE:To improve the adhesive strength of a semiconductor wafer, by forming the difference in the thickness of the time when the load of 300gf/cm<2> is applied and that of the time when the load of 1800gf/cm<2> is applied in 1-100mum, forming a hole on the wafer holding face and making this bore diameter in 10-30mum. CONSTITUTION:A backing pad 1 used for a holding jig which holds a semiconductor wafer 8 at the specular polishing stage of the semiconductor wafer 8 is made of a hydrophobic foaming body. Moreover, the diffewrence in the thickness of this pad 1 at the time when the load of 300gf/cm<2> is applied and that of the time when the load of 1800gf/cm<2> is applied is taken in 1-100mum. A hole 2 is formed on this wafer holding face and this bore diameter is amde in 10-30mum. After the precise flattening of this backing plate 1, the ware 8 is held and polished by the wafer holding jig that the template 6 having more than one hole for wafer positioning on a carrier plate 3 is fixed so that the backing pad 1 may come into the hole for positioning.
申请公布号 JPH0413568(A) 申请公布日期 1992.01.17
申请号 JP19900114066 申请日期 1990.04.27
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 HASHIMOTO HIROMASA
分类号 B24B37/30;H01L21/304 主分类号 B24B37/30
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