发明名称 ADDRESS CONVERTER FOR SEMICONDUCTOR MEMORY TEST EQUIPMENT
摘要 PURPOSE:To effectively use a scramble memory by providing an output part data selector to which the output of an input part data selector and the read output of the scramble memory are inputted. CONSTITUTION:An input part data selector 12 performs such selection that only bits to be converted by operation out of all bits of a 16-bit X address are supplied to an X address scramble memory 13x as the address. An output part data selector 12x selects required bits of the 12-bit output read out of the memory 13x and outputs them to prescribed bit positions. The input part data selector 12 selects bits, which are not converted by operation, from the 16-bit X address and outputs them to prescribed bit positions, and a 16-bit X address subjected to prescribed address conversion as the whole is obtained. The Y address is converted in the same manner.
申请公布号 JPH043400(A) 申请公布日期 1992.01.08
申请号 JP19900104605 申请日期 1990.04.20
申请人 ADVANTEST CORP 发明人 IMADA HIDEAKI
分类号 G06F11/22;G11C29/00;G11C29/10 主分类号 G06F11/22
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