| 摘要 |
PCT No. PCT/GB89/00664 Sec. 371 Date Feb. 14, 1991 Sec. 102(e) Date Feb. 14, 1991 PCT Filed Jun. 14, 1989 PCT Pub. No. WO89/12816 PCT Pub. Date Dec. 28, 1989.A method and apparatus for determining the existence of misorientation in a crystal, comprising irradiating the crystal with X-rays pre-orientating any crystallographic plane of the crystal with respect to the axis of the X-rays, imaging X-rays received from the crystal so as to cause a plurality of effectively angularly-separated images to be formed, the energy of the X-rays being such that while carrying out the method at least some of the X-rays forming the images have intersected the whole depth of the portion of the crystal being examined, and determining the existence of any misorientation from the images.
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