发明名称 Wire bond through-via structure and method
摘要 A stackable integrated circuit chip layer and module device that avoids the use of electrically conductive elements on the external surfaces of a layer containing an integrated circuit die by taking advantage of conventional wire bonding equipment to provide an electrically conductive path defined by a wire bond segment that is encapsulated in a potting material so as to define an electrically conductive wire bond “through-via” accessible from at least the lower or second surface of the layer.
申请公布号 US9431275(B2) 申请公布日期 2016.08.30
申请号 US201113209898 申请日期 2011.08.15
申请人 PFG IP LLC 发明人 Bindrup Randy;Boyd W. Eric;Leon John;Yamaguchi James;Pepe Angel
分类号 H01L23/488;H01L21/56;H01L23/00;H01L25/10 主分类号 H01L23/488
代理机构 代理人 Freiburger Thomas M.
主权项 1. An electronic device comprising: a layer comprising a first surface and a second surface, an integrated circuit chip having an active surface with a bond pad and an inactive surface, and, a cross-section of an encapsulated wire bond segment in electrical connection with the bond pad and exposed on the second surface of the layer.
地址 San Francisco CA US