发明名称 |
Wire bond through-via structure and method |
摘要 |
A stackable integrated circuit chip layer and module device that avoids the use of electrically conductive elements on the external surfaces of a layer containing an integrated circuit die by taking advantage of conventional wire bonding equipment to provide an electrically conductive path defined by a wire bond segment that is encapsulated in a potting material so as to define an electrically conductive wire bond “through-via” accessible from at least the lower or second surface of the layer. |
申请公布号 |
US9431275(B2) |
申请公布日期 |
2016.08.30 |
申请号 |
US201113209898 |
申请日期 |
2011.08.15 |
申请人 |
PFG IP LLC |
发明人 |
Bindrup Randy;Boyd W. Eric;Leon John;Yamaguchi James;Pepe Angel |
分类号 |
H01L23/488;H01L21/56;H01L23/00;H01L25/10 |
主分类号 |
H01L23/488 |
代理机构 |
|
代理人 |
Freiburger Thomas M. |
主权项 |
1. An electronic device comprising:
a layer comprising a first surface and a second surface, an integrated circuit chip having an active surface with a bond pad and an inactive surface, and, a cross-section of an encapsulated wire bond segment in electrical connection with the bond pad and exposed on the second surface of the layer. |
地址 |
San Francisco CA US |