发明名称 Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium
摘要 A method of manufacturing a semiconductor device includes forming a thin film containing a specific element, oxygen, carbon, and nitrogen by performing a cycle a predetermined number of times. The cycle includes supplying a specific element-containing gas, supplying a carbon-containing gas, supplying an oxidizing gas, and supplying a nitriding gas. The act of supplying the nitriding gas is performed before the act of supplying the specific element-containing gas, and the act of supplying the carbon-containing gas and the act of supplying the oxidizing gas are not performed until the act of supplying the specific element-containing gas is performed.
申请公布号 US9431236(B2) 申请公布日期 2016.08.30
申请号 US201514595046 申请日期 2015.01.12
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 Sasajima Ryota;Nakamura Yoshinobu
分类号 H01L21/31;C23C16/00;H01L21/02;C23C16/36;C23C16/455;C23C16/52 主分类号 H01L21/31
代理机构 Volpe and Koening, P.C. 代理人 Volpe and Koening, P.C.
主权项 1. A method of manufacturing a semiconductor device, comprising: (a) modifying an outermost surface of a substrate by supplying a nitriding gas to the substrate; and (b) forming a thin film containing a specific element, oxygen, carbon, and nitrogen on the modified outermost surface of the substrate by performing a cycle one or more times, the cycle comprising sequentially performing: (b-1) supplying a specific element-containing gas to the substrate;(b-2) supplying an oxidizing gas to the substrate;(b-3) supplying a carbon-containing gas to the substrate; and(b-4) supplying a nitriding gas to the substrate.
地址 Tokyo JP