发明名称 |
Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium |
摘要 |
A method of manufacturing a semiconductor device includes forming a thin film containing a specific element, oxygen, carbon, and nitrogen by performing a cycle a predetermined number of times. The cycle includes supplying a specific element-containing gas, supplying a carbon-containing gas, supplying an oxidizing gas, and supplying a nitriding gas. The act of supplying the nitriding gas is performed before the act of supplying the specific element-containing gas, and the act of supplying the carbon-containing gas and the act of supplying the oxidizing gas are not performed until the act of supplying the specific element-containing gas is performed. |
申请公布号 |
US9431236(B2) |
申请公布日期 |
2016.08.30 |
申请号 |
US201514595046 |
申请日期 |
2015.01.12 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
Sasajima Ryota;Nakamura Yoshinobu |
分类号 |
H01L21/31;C23C16/00;H01L21/02;C23C16/36;C23C16/455;C23C16/52 |
主分类号 |
H01L21/31 |
代理机构 |
Volpe and Koening, P.C. |
代理人 |
Volpe and Koening, P.C. |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
(a) modifying an outermost surface of a substrate by supplying a nitriding gas to the substrate; and (b) forming a thin film containing a specific element, oxygen, carbon, and nitrogen on the modified outermost surface of the substrate by performing a cycle one or more times, the cycle comprising sequentially performing:
(b-1) supplying a specific element-containing gas to the substrate;(b-2) supplying an oxidizing gas to the substrate;(b-3) supplying a carbon-containing gas to the substrate; and(b-4) supplying a nitriding gas to the substrate. |
地址 |
Tokyo JP |