| 摘要 |
<p>PURPOSE:To extend the use of a test while spreading a range of application of the device by adding a Zener diode and a variable resistor for adjustment between a variable resistor for setting the frequency of a sine wave generating circuit and a multiplier. CONSTITUTION:The Zener diode 20 and the variable resistor 21 for adjustment are added between the variable resistor 11 for setting frequency and the multiplier 17 in the sine wave generating circuit for a speed generator. Analog output voltage Va is added to the multiplier 17 while another frequency setting voltage Vf is converted into output voltage by means of the Zener diode 20 by turning the variable resistor 11, voltage a is applied to the multiplier 17, and the rise of the output of the multiplier 17 is large and flat characteristics can be obtained after voltage rises to some extent. Accordingly, a range of application of the memory element built-in type since wave generating circuit is spread, and the use of the test and the range of application of the device can be extended.</p> |
