TEST PATTERN SIGNAL GENERATING CIRCUIT,申请号KR19870024577U-传众专利搜索

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发明名称	TEST PATTERN SIGNAL GENERATING CIRCUIT
摘要
申请公布号	KR910006196(Y1)	申请公布日期	1991.08.19
申请号	KR19870024577U	申请日期	1987.12.31
申请人	GOLD STAR CO.,LTD.	发明人	YANG TAE-KWON
分类号	H04N17/02;(IPC1-7):H04N17/02	主分类号	H04N17/02
代理机构		代理人
主权项
地址

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