发明名称 Tomographic measuring device - measures three=dimensional micro-magnetic or microelectronic fields with rotating device
摘要 Tomographic measuring unit in which an electron beam is directed into the field of the object being measured, and is detected by a read out means. The object is arranged on the rotating plate (12) of a rotating device (11) and rotates about an axis (13) perpendicular to the beam. The rotating device (11) comprises three position members (20 to 22) with piezoelectric adjustable axial lengths (L) which contact the plate (12) via connection elements (23 to 25) with ball joints (26 to 28) arranged in a circle (K2) of relatively small radius. USE/ADVANTAGE - For measurement of three dimensional micro magnetic or microelectronic fields. Simple construction. Enables accurate measurement.
申请公布号 DE4003670(A1) 申请公布日期 1991.08.14
申请号 DE19904003670 申请日期 1990.02.07
申请人 SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE 发明人 STECK, MATTHIAS, 4100 DUISBURG, DE;KUBALEK, ERICH, PROF. DR., 5100 AACHEN, DE;BALK, LUDWIG JOSEF, DR., 4154 TOENISVORST, DE;SCHEWE, HERBERT, DR., 8522 HERZOGENAURACH, DE
分类号 G01R29/08;G01R31/305;G01R33/02;H01J37/20;H01J37/26 主分类号 G01R29/08
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