发明名称 Field-effect transistor having a vertical structure and method of manufacturing the same.
摘要 <p>According to this invention, there is provided a semiconductor device including a semiconductor substrate (1) of a first conductivity type, single continuous cylindrical regions (4) formed on a surface of the semiconductor substrate (1) and having side walls opposite to each other at at least one portion, a first insulating film (5) which is formed on the side wall of the cylindrical region (4) and on a bottom surface of a groove (3) formed by the cylindrical regions (4) and which projects from the side wall of the cylindrical region (4), a conductive layer (6) formed on the first insulating film (5), a second insulating film (5) formed on the conductive layer (6), a first impurity region (71) of a second conductivity type formed at a position below the bottom surface of the groove (3) of the semiconductor substrate (1), a second impurity region (102) of the second conductivity type formed on a top surface of the cylindrical region (4), first and second metal layers (101, 102) for filling the groove (3) and a portion surrounded by the top surface of the cylindrical region (4) and the first insulating film (5), and a third insulating film (12) for covering the first and second metal layers (101, 102).</p>
申请公布号 EP0439164(A2) 申请公布日期 1991.07.31
申请号 EP19910100892 申请日期 1991.01.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MIZUNO, TOMOHISA, C/O INTELLECTUAL PROPERTY DIV.
分类号 H01L21/338;H01L29/06;H01L29/78;H01L29/812 主分类号 H01L21/338
代理机构 代理人
主权项
地址