PROM speed measuring method.

摘要

A method for measuring the access time or speed of PROM devices is described. The PROM (10) includes a matrix of erased memory cells (30-70) each selectable by an address, and readable by a sense amplifier (112). A valid address is then provided, and the memory cell addressed is read. The above steps are repeated until all memory cells are read. In this manner, the time required to access an erased memory cell after accessing a programmed memory cell, as simulated by a nonexistent memory cell, may be measured. <IMAGE>