发明名称 |
THIN FILM CONSISTING OF SIC AND SI3N4, PRODUCTION THEREOF AND MASK FOR X-RAY LITHOGRAPHY |
摘要 |
PURPOSE:To produce a thin film having superior visible light transmissivity by carrying out film formation on a substrate by sputtering with a target consisting of SiC and Si3N4 in a specified molar ratio. CONSTITUTION:A target consisting of SiC and Si3N4 in (95:5)-(30:70) molar ratio is used. Electric power is supplied to the target by about >=5W/cm<2> under about 1X10<-2>-1X10<-1>Torr pressure and film formation is carried out on a substrate at about 100-1,000 deg.C by magnetron sputtering or other method. A thin film having 1X10<8>-1X10<10> dyne/cm<2> tensile stress, high energy beam and chemical resistances is obtd. This thin film is suitable for a mask for X-ray lithography. |
申请公布号 |
JPH0356660(A) |
申请公布日期 |
1991.03.12 |
申请号 |
JP19890192977 |
申请日期 |
1989.07.26 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
KASHIDA SHU;KUBOTA YOSHIHIRO;NAGATA AKIHIKO |
分类号 |
C01B21/082;C01B31/36;C23C14/06;G03F1/22;H01L21/027;H01L21/30 |
主分类号 |
C01B21/082 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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