发明名称 DIAGNOSTIC CIRCUIT FOR SEMICONDUCTOR
摘要 PURPOSE:To decide acceptables or defectives by regarding the response series of n bits obtained by applying inspection series to a circuit to be inspected as the coefficient of a n-1 degree polynomial expression and comparing residual, which is obtained by dividing the polynomial expression by a sufficiently small degree polynomial expression while using two as a divisor, with the residual of right value. CONSTITUTION:An example applied to the diagnosis of the trouble of a ROM will be mentioned. The inspection series are generated by means of an inspection series circuit consisting of the binary counter 1 of ten bit constitution, and the series are applied to the ROM3 as the circuit to be inspected through an address not output generating circuit 2. The output of the ROM3 is inputted to a circuit to be inspected composed of a sensing amplifying circuit 4, and the output E of the sensing amplifying circuit 4 is further inputted to the shift register 5 of sixteen bit constitution. The shift register 5 has a function holding residual obtained by dividing the response series by the sixteen degree polynomial expression while using two as the divisor. Lastly, the sixteen bit output of the shift register 5 is compared with right residual by means of a comparison circuit 6, and path-fail signals P/F, which are 1 when the result is right and are 0 when it is erroneous, are outputted.
申请公布号 JPS57169255(A) 申请公布日期 1982.10.18
申请号 JP19810053897 申请日期 1981.04.10
申请人 TOKYO SHIBAURA DENKI KK 发明人 KANUMA AKIYOSHI
分类号 G01R31/26;G01R31/28;G06F11/22;G06F11/277;G11C29/56;H01L21/66;H01L21/822;H01L27/04 主分类号 G01R31/26
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