| 摘要 |
<p>PURPOSE:To improve efficiency for the test of a memory address generating part and the test of program debugging by respectively connecting the outputs of the plural memory address generating parts to external terminals by buses. CONSTITUTION:The outputs of memory address generating parts 1-3, which apply addresses to a memory 10, are connected by external terminals 31-33 by buses 21-23 so as to be monitored in the external terminals 31-33. Thus, for testing the outputs of the memory address generating parts 1-3, it can be decided by monitoring the outputs in the external terminals 31-33 whether they are correct or not. When bugging is investigated, it can be easily discovered and the efficiency for the test is improved.</p> |
