发明名称 MISFET AND METHOD OF PRODUCING THE SAME
摘要 <p>A MISFET of a structure in which each of the source and the drain has a low-concentration region and a high-concentration region and a method of producing the same. In a MOS transistor having an LDD (lightly doped drain) structure, the gate is expanded up to the upper portion of the low-concentration region of each of the source and drain. This makes it possible to prevent the drain resistance from fluctuating by the generation of hot electrons.</p>
申请公布号 WO1991002379(P1) 申请公布日期 1991.02.21
申请号 JP1990000917 申请日期 1990.07.16
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