Wafer scale integrated circuit device.

摘要

In a wafer scale integrated circuit device having functional blocks (211,212,...2nm) in rows and columns on the wafer (1) each of blocks are interconnected by local lines, power supply lines, and input signal lines constituted by a command signal transmitting line (43) and a wafer clock signal transmitting line (42). Input protection (511,512,...5nm; 611,612...6nm) for preventing an overshot or undershot level of the input signal are provided between each functional block and the command signal transmitting line (43) and the wafer clock signal transmitting line (42). Consequently, the input command signal (CMND) and the wafer clock signal (WCK) are delayed and rounded to the same degree for each and every functional block. Therefore, a high operational speed with a small operational margin can be realized by preventing synchronization error.