发明名称 Integrated semiconductor circuit for thermal measurements.
摘要 <p>Integrated semiconductor circuit for thermal measurements, comprising at least a temperature or a heat current sensor and a signal comparator (8), the comparator (8) being provided with a signal feedback loop containing a DA signal converter (3), more specifically, the comparator (8) being a temperature or a heat current comparator, the DA signal-converter (3) comprising a power output and the signal feedback loop comprising components for the transfer of thermal signals.</p>
申请公布号 EP0404218(A1) 申请公布日期 1990.12.27
申请号 EP19900201455 申请日期 1990.06.07
申请人 BRONKHORST HIGH-TECH B.V. 发明人 HUIJSING, JOHAN HENDRIK;RIEDIJK, FRANK ROBERT
分类号 G01K7/00;G01F1/68;G01F1/696;G01F1/698;G01K17/04;G01L21/10;G01N25/20;G08C13/00 主分类号 G01K7/00
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