发明名称 |
Integrated semiconductor circuit for thermal measurements. |
摘要 |
<p>Integrated semiconductor circuit for thermal measurements, comprising at least a temperature or a heat current sensor and a signal comparator (8), the comparator (8) being provided with a signal feedback loop containing a DA signal converter (3), more specifically, the comparator (8) being a temperature or a heat current comparator, the DA signal-converter (3) comprising a power output and the signal feedback loop comprising components for the transfer of thermal signals.</p> |
申请公布号 |
EP0404218(A1) |
申请公布日期 |
1990.12.27 |
申请号 |
EP19900201455 |
申请日期 |
1990.06.07 |
申请人 |
BRONKHORST HIGH-TECH B.V. |
发明人 |
HUIJSING, JOHAN HENDRIK;RIEDIJK, FRANK ROBERT |
分类号 |
G01K7/00;G01F1/68;G01F1/696;G01F1/698;G01K17/04;G01L21/10;G01N25/20;G08C13/00 |
主分类号 |
G01K7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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