Means to detect and locate pinching and chafing of conduits.

摘要

A conduit (10) has a core (12) and an axial length (13) susceptible to being pinched and chafed by other structure (36) adjacent the conduit. An inner semiconductive layer (20) extends the length of the conduit susceptible to being pinched and has a reference point (22) adapted to be electrically connected with a detecting circuit (26) for detecting a pinch and/or a computing unit for determining the location of a pinch. A resiliently compressible electrical switching layer (20), which is nonconducting when not pinched and conducting when pinched, is superposed against the inner semiconductive layer.