Eddy current testing system using two samples with different time lags

摘要

A pulsed eddy current testing system for detecting defects in a part. A probe carries an exciting pulse in one coil and receives a measuring signal in a second coil. The measuring signal is sampled at two instants defined by short and long time lags. The two amplitudes obtained are plotted in a representative plane having two reference axes. The point having the signals as coordinates describes a figure eight, when the part has a defect. The size and orientation of the figure gives information on the defect in the part.