发明名称 |
SILICON PHOTO DIODE FOR LOW SENSING |
摘要 |
The photo diode is manufactured by steps; (a) forming a N type well (2) by diffusing the P ion on a P type wafer (1); (b) forming a field oxide layer on an active field region; (c) forming a high density N+ region (3) by diffusing the As ion; (d) forming a high density P+ region (4) by diffusing the B ion; (e) and forming a non-reflective and metal layer. The P+ guide ring region (5) surrounds the diffused regions (3,4). |
申请公布号 |
KR900005127(B1) |
申请公布日期 |
1990.07.19 |
申请号 |
KR19870006725 |
申请日期 |
1987.06.30 |
申请人 |
SAM SUNG ELECTRONIC CO., LTD. |
发明人 |
SON HAE-YUN |
分类号 |
H01L31/10;(IPC1-7):H01L31/06 |
主分类号 |
H01L31/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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