| 摘要 |
The circuit having compatibility between systems for testing MDDEM includes a central process unit (10, 100) transmitting data for controlling loop construction according to test, an address decoder latch (11,110) generating control signal by decoding output address and conrol signal of the CPU, and a latch (12, 120) chip selected by control signal of the latch (11,110) for latching control data according to kind of loopback test so that switches (S1-S4,S'1-S'4) is controlled for executing loopback function.
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