发明名称 LOGIC UNIT TEST DEVICE FOR SPECIAL ENVIRONMENT DEVICE
摘要 PURPOSE:To economically realize a test device for a logic unit of a special environment device by replacing electrically the logic unit with a general-purpose logic unit of a test device having the characteristic equivalent to those of the logic unit. CONSTITUTION:The general-purpose logic units (5-1) - (5-n) form a circuit equivalent to the logic unit 2 of a special environment device on an ordinary general- purpose base board. When the unit 3 is tested, one of units (5-1) - (5-n) is pulled out of a connector and the unit 3 of the special environment device to be tested is connected to the corresponding one of conversion parts (4-1) - (4-n). Then the unit 3 is tested by an external test device 2. Thus it is not required to produce a complicated test device exclusive for the unit 3 of the special environment device having an extremely small number of products. As a result, the test device is economically obtained for the unit 3 of the special environment device.
申请公布号 JPH02146636(A) 申请公布日期 1990.06.05
申请号 JP19880299581 申请日期 1988.11.29
申请人 FUJITSU LTD 发明人 SAEKI KENSUKE;OSHITA KATSUNORI
分类号 G06F11/22 主分类号 G06F11/22
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