| 摘要 |
PURPOSE:To prevent the mutual interference defect in a page buffer register and to expand the checking circuit range by inputting the data input from an external part from the page address register side of a page register at the time of a test mode. CONSTITUTION:At a page register 8, a master side page buffer register 12 and a slave side page address register 14 are provided. At the time of the test mode, the data input from an external part is directly inputted to a slave side page address register 14 and the data input from the external part does not pass through to the master side page buffer register 12. Accordingly, the alteration range of the data in the page register 8 at the time of being the test mode is limited to the page address register 14 and the data at the page buffer register 12 side are preserved. In such a way, since the data of the page buffer register 12 are not changed, the mutual interference defect of the page buffer register 12 can be checked and the checking range can be expanded. |
