发明名称 |
BIPOLAR TRANSISTOR WITH A REDUCED BASE RESISTANCE, AND METHOD FOR THE PRODUCTION OF A BASE CONNECTION REGION FOR A BIPOLAR TRANSISTOR STRUCTURE |
摘要 |
To reduce the base resistance in the bipolar transistor structure, the base connection region is designed as a multilayer structure. The multilayer structure contains a doped polysilicon layer (3), an electrically conducting diffusion barrier layer (4) which prevents an upward diffusion of the dopants from the polysilicon layer (3) and, consequently, a dopant depletion in the polysilicon layer (3), a metal silicide layer (5) and an SiO2 layer (6). The polysilicon (3), the diffusion barrier (4) and the metal silicide layers (5) have common, vertical etching profiles. <IMAGE> |
申请公布号 |
EP0343563(A3) |
申请公布日期 |
1990.05.09 |
申请号 |
EP19890109171 |
申请日期 |
1989.05.22 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
KABZA, HERBERT, DR.;PROBST, VOLKER;SCHABER, HANS-CHRISTIAN, DR. |
分类号 |
H01L29/73;H01L21/331;H01L23/532;H01L29/423;H01L29/732;(IPC1-7):H01L29/60;H01L29/58 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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