发明名称 BIPOLAR TRANSISTOR WITH A REDUCED BASE RESISTANCE, AND METHOD FOR THE PRODUCTION OF A BASE CONNECTION REGION FOR A BIPOLAR TRANSISTOR STRUCTURE
摘要 To reduce the base resistance in the bipolar transistor structure, the base connection region is designed as a multilayer structure. The multilayer structure contains a doped polysilicon layer (3), an electrically conducting diffusion barrier layer (4) which prevents an upward diffusion of the dopants from the polysilicon layer (3) and, consequently, a dopant depletion in the polysilicon layer (3), a metal silicide layer (5) and an SiO2 layer (6). The polysilicon (3), the diffusion barrier (4) and the metal silicide layers (5) have common, vertical etching profiles. <IMAGE>
申请公布号 EP0343563(A3) 申请公布日期 1990.05.09
申请号 EP19890109171 申请日期 1989.05.22
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 KABZA, HERBERT, DR.;PROBST, VOLKER;SCHABER, HANS-CHRISTIAN, DR.
分类号 H01L29/73;H01L21/331;H01L23/532;H01L29/423;H01L29/732;(IPC1-7):H01L29/60;H01L29/58 主分类号 H01L29/73
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