TESTING METHOD FOR SOLID-STATE IMAGE PICKUP DEVICE

摘要

PURPOSE:To shorten the time required for data taking-in to shorten the overall test time by performing multipoint sampling in one read period with respect to each picture element of a solid-state image pickup device. CONSTITUTION:The output signal from each picture element has a reset period 101, a black reference level period 102, and an image pickup signal output period 103. A pulse 201 samples the black reference value, and a pulse 202 samples the image pickup signal value. Eight pulses are included in a black reference sampling period 301, and the black reference value is sampled 8 times by 8 pulses. Sixty-four pulses are included in an image pickup signal sampling period 302, and the image pickup signal value is sampled 64 times by 64 pulses. The signal is taken in by this sampling once or an arbitrary number of times. It is discriminated based on sampled values whether a semiconductor device is good or not.