发明名称 |
Memory device containing a static RAM memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static RAM memory. |
摘要 |
<p>There is described a memory device that contains a static RAM-memory. This is provided with data input and date output registers, an address register, and a control register for storing various control signals. The RAM has three principal modes: a. in a normal mode, all registers are accessible externally so that the memory may fulfill its standard function, b. in a scan-state, all the cited register constitute a synchronous shift register that may be serially written with a test pattern and serially read with a result pattern; in this way the memory may be subjected to a test according to the scan test principle, c. in a self test state the communication with the outer world is shut off, the address register counts through successive addresses, the memory is cycled through read-modify or read-modify-read operations, and the data read is conversed to a signature pattern for subsequent scan-out. In this way a quasi stand-alone test facility is realized. Various additonal features may be implemented.</p> |
申请公布号 |
EP0350538(A1) |
申请公布日期 |
1990.01.17 |
申请号 |
EP19880201501 |
申请日期 |
1988.07.13 |
申请人 |
N.V. PHILIPS' GLOEILAMPENFABRIEKEN |
发明人 |
DEKKER, ROBERTUS WILHELMUS CORNELIS;THIJSSEN, ALOYSIUS PETRUS;BEENKER, FRANCISCUS PETRUS MARIA;JANSEN, JORIS FRANS PIETER |
分类号 |
G11C29/00;G06F11/22;G11C11/401;G11C29/12;G11C29/20;G11C29/40 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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