| 摘要 |
PURPOSE:To form a test pattern program satisfying the timing measure of an LSI test, by adding various means of a condition/order parallelizing part to a test pattern generator. CONSTITUTION:The microprogram translated from a test pattern program of high grade words is stored in a microprogram memory 200. When the orders in the microprogram are investigated in execution order by a condition branching order detection means 201 and a condition branching order is detected, the step number thereof is sent to a parallelization possibility judge means 202. Herein, it is judged whether parallelization is possible in relation to the step number and,when parallelization is possible, said step number is sent to a parallelization executing means 203 and the result of parallelization is stored in the memory 200. When the parallelization is impossible, procedure is again repeated from the means 201. Further, when there is no condition branching order in the memory 200, parallel processing is finished and the content of the memory 200 is outputted as a test pattern program. |
