发明名称 |
Charged particle beam apparatus. |
摘要 |
<p>A superconductive screening is provided around, for example, the specimen chamber or optical spaces to be considered therefor in a charged particle beam apparatus for screening from external or internal stray magnetic fields or magnetic inhomogeneities. By constructing the said screenings from a ceramic superconductive material with terminal seals having only a small aperture for the passage of a particle beam, a mutual influencing of the optical elements can also be strongly reduced.</p> |
申请公布号 |
EP0333240(A1) |
申请公布日期 |
1989.09.20 |
申请号 |
EP19890200269 |
申请日期 |
1989.02.06 |
申请人 |
N.V. PHILIPS' GLOEILAMPENFABRIEKEN |
发明人 |
BOLGER, BOUWE;SLINGERLAND, HENDRIK NICOLAAS |
分类号 |
H01J37/20;H01J37/09;H01J37/141;H01J37/16 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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