发明名称 Charged particle beam apparatus.
摘要 <p>A superconductive screening is provided around, for example, the specimen chamber or optical spaces to be considered therefor in a charged particle beam apparatus for screening from external or internal stray magnetic fields or magnetic inhomogeneities. By constructing the said screenings from a ceramic superconductive material with terminal seals having only a small aperture for the passage of a particle beam, a mutual influencing of the optical elements can also be strongly reduced.</p>
申请公布号 EP0333240(A1) 申请公布日期 1989.09.20
申请号 EP19890200269 申请日期 1989.02.06
申请人 N.V. PHILIPS' GLOEILAMPENFABRIEKEN 发明人 BOLGER, BOUWE;SLINGERLAND, HENDRIK NICOLAAS
分类号 H01J37/20;H01J37/09;H01J37/141;H01J37/16 主分类号 H01J37/20
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