发明名称 METHOD OF MANUFACTURING DIELECTRIC ISOLATION REGIONS FOR A SEMICONDUCTOR DEVICE
摘要 A method of manufacturing a semiconductor device which comprises a step of forming a first groove in a semiconductor layer, a step of filling the first groove with a first insulating film, a step of selectively etching the first insulating film in the first groove to form at least one second groove having a small width, and a step of filling the second groove with a second insulating film to form an isolation layer having a large width and substantially flush with the semiconductor layer.
申请公布号 DE3279874(D1) 申请公布日期 1989.09.14
申请号 DE19823279874 申请日期 1982.08.19
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAMEYAMA, SHUICHI;SHINOZAKI, SATOSHI;IWAI, HIROSHI
分类号 H01L21/762;H01L21/763;(IPC1-7):H01L21/76 主分类号 H01L21/762
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