发明名称 Verfahren zum Herstellen von Duennschichtbauelementen mit mindestens einer isolierenden Zwischenschicht
摘要 <p>Described is a method of producing thin layer components, separated by at least one insulating layer and comprised of semiconductor material, particularly silicon. The method is characterized by the fact that an amorphous layer of insulated material is pyrolytically precipitated on a substrate wafer, comprised of monocrystalline semiconductor material. The amorphous layer is converted into a monocrystalline layer by using the monocrystalline substrate and the thus formed substrate, which has a homogeneous crystallographic orientation, is used to grow another epitactic semiconductor layer, preferably of silicon.</p>
申请公布号 DE1769627(A1) 申请公布日期 1971.10.21
申请号 DE19681769627 申请日期 1968.06.19
申请人 SIEMENS AG 发明人 SEITER,HARTMUT,DIPL.-CHEM.DR.
分类号 H01L27/00;C23C16/44;C30B1/02;C30B25/02;C30B25/18;C30B25/22;H01L21/20;H01L21/306;H01L21/316;H01L21/762;H01L21/86;H01L23/29;H01L27/12 主分类号 H01L27/00
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