发明名称 METHOD AND DEVICE FOR POLISHING SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE:To polish a semiconductor wafer to high flatness by rotating a hard plate while uniformly pressing the whole face thereof from its back face via a rigid press plate. CONSTITUTION:A fluid is fed under pressure into a cylinder 14 to press a press plate 11 of a rigid material via a piston 13, and the whole face of a glass plate 3 is uniformly pressed from its back face via a cushion sheet 12. Thereby, a semiconductor wafer 4 which is bonded to the glass plate 3 is uniformly pressed against a surface plate 1. In this condition, the press plate 11 is rotated via a shaft 8 sliding the semiconductor wafer 4 on the surface of the surface plate 1 to polish the semiconductor wafer by means of the abrasive cloth 2 of the surface plate 1 at a high flatness.
申请公布号 JPH01216768(A) 申请公布日期 1989.08.30
申请号 JP19880043564 申请日期 1988.02.25
申请人 SHOWA DENKO KK;SHOWA DENKO SILICON KK 发明人 HIRAYAMA KOICHIRO
分类号 H01L21/304;B24B37/005;B24B37/10 主分类号 H01L21/304
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