| 摘要 |
An eddy current testing device for inspecting test objects, for example billets, with respect to surface defects, for example surface cracks, comprises at least one transducer/sensor, for example a surface transducer or surface transducer arrangement, which is made to scan the surface of the test object. The device is characterized in that the effect of harmless surface blemishes on the testing device is suppressed, at least partially, by compensating for the sensitivity characteristic, in the scan direction of the transducer/sensor, with respect to the surface defect.
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