| 摘要 |
A contacting mechanism in the form of what is referred to as a needle card for micro-electronic components to be tested and having a large number of poles. Contacting needles of the contacting card are fashioned U-shaped and are arranged such that one of the two legs of the needles projects perpendicularly down through a narrowly toleranced guide hole in the needle card, its tip pressing resiliently against a contact spot of the component to be tested. The other leg of the needles is connected to leads of testing equipment. A part of the needles connecting the two legs is fashioned straight-line and is arranged at a close distance to the needle card.
|
