发明名称 SERVICE INTERRUPTION DETECION-CIRCUIT
摘要 The circuit comprises a fail compensation unit for main taining constant voltage level at momentary power fail, a fail detecting unit for perceiving the power fail causing the false operation of system at less than system resetting power fail, and a failure detection maintaining latch unit. The circuit utilizes CMOS to lessen the energy consumption.
申请公布号 KR890002188(B1) 申请公布日期 1989.06.22
申请号 KR19860009187 申请日期 1986.10.31
申请人 SAMSUNG ELECTRONICS CO. LTD. 发明人 HO CHAN;SONG BYONG-JUN;JIN TAE-HOON;LEE BYUNG-JUN
分类号 H02H3/24;(IPC1-7):H02H3/24 主分类号 H02H3/24
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