发明名称 Automatic analysis device and control method therefor
摘要 An automatic analysis device has, according to the invention, a sample removal device which has a sample holder and a sample nozzle, a multiplicity of reaction containers which are carried by a reaction disc, and a control unit which has a device for the automatic changing of the working sequence of the sample removal device, without changing a cycle time of the reaction disc, into one of the working sequences I, II, and III in conformity with the analysis procedures. The working sequence I has one step for moving the sample nozzle from one of the sample containers directly to an associated reaction container, and has the same cycle time as the reaction disc. The working sequence II has one step for cleaning the outer peripheral wall of the sample nozzle in the course of the movement of the sample nozzle from one of the sample holders to an associated reaction container, and has a cycle time and a sample drawing-in time which are identical with those of the working sequence I. The working sequence III has one step for cleaning the outer peripheral wall of the sample nozzle in the course of the movement of the sample nozzle from one of the sample holders to an associated reaction container, and has a cycle time which is an integer multiple of the cycle time of the working sequence I, and a sample draw-in time which is smaller than that in working sequence I or II.
申请公布号 DE3839896(A1) 申请公布日期 1989.06.08
申请号 DE19883839896 申请日期 1988.11.25
申请人 HITACHI, LTD., TOKIO/TOKYO, JP 发明人 UCHIDA, HIROYASU;SATO, TAKEHIDE;MIMURA, TOMONORI, KATSUTA, JP
分类号 G01N35/10;G01N1/00;G01N35/02 主分类号 G01N35/10
代理机构 代理人
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