METHOD OF DETERMINING ELECTRON DIFFUSION LENGTH IN SEMICONDUCTOR,申请号SU19874302480-传众专利搜索

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发明名称	METHOD OF DETERMINING ELECTRON DIFFUSION LENGTH IN SEMICONDUCTOR
摘要
申请公布号	SU1485327(A1)	申请公布日期	1989.06.07
申请号	SU19874302480	申请日期	1987.06.30
申请人	ANDRUSHCHENKO ALEKSANDR L,SU;KLIMIN ALEKSANDR,SU;STUCHINSKIJ GEORGIJ B,SU;SHCHEMELEV VLADISLAV N,SU	发明人	ANDRUSHCHENKO ALEKSANDR L,SU;KLIMIN ALEKSANDR I,SU;STUCHINSKIJ GEORGIJ B,SU;SHCHEMELEV VLADISLAV N,SU
分类号	H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
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