| 摘要 |
Self-test mechanisms in flight and safety-critical devices must be carefully tested and accepted. In present-day practice, improper methods are used in order to accept these mechanisms. The only permissible method of accepting a device is if the device is under actual operating conditions, i.e. inter alia, that the housing must be closed or the acceptance must take place in an environmental chamber. Methods which prove the detection of the most elementary faults, e.g. the separation of a pin from an integrated circuit, are not effective in modern circuits with thousands of gates. In order to solve the problems of the prior art, individual circuits of a circuit can be called up individually or in different combinations by building in components provided with known faults. After careful analysis of the fault types of the circuit, the satisfactory components can be replaced by the components provided with known faults, and the fault-detecting capability of the self-test mechanism can then be tested under operational conditions. In order to reduce the reequipment time, several such components provided with faults can be simultaneously inserted. In order to test and to accept the self-test mechanism at operating extremes of temperature and voltage, components provided after intensive analyses with faults and weaknesses can be ... into the circuit ... Original abstract incomplete. |
