发明名称 Method and apparatus for measuring strong microwave electric field strengths
摘要 A method and apparatus for measuring strong microwave electric field strengths is disclosed. The apparatus includes a first active temperature probe in cooperation with susceptor means for measuring a temperature indicative of the heating effects of microwave radiation at a test location, and an ambient temperature probe for measuring ambient temperature. The temperature differential between the two probes is used by calibration means for determining electric field strength at the test location. The method includes the steps of heating a susceptor means with microwave radiation, and measuring a temperature indicative of the heating effects of microwave radiation at the test location. Ambient temperature is measured, and the temperature differential used to determine the magnitude of the electric field strength.
申请公布号 US4816634(A) 申请公布日期 1989.03.28
申请号 US19870113128 申请日期 1987.10.23
申请人 LENTZ, RONALD R.;WENDT, DAN J.;KEMSKE, JONATHON D.;PESHECK, PETER S. 发明人 LENTZ, RONALD R.;WENDT, DAN J.;KEMSKE, JONATHON D.;PESHECK, PETER S.
分类号 G01R29/08;(IPC1-7):H05B6/80 主分类号 G01R29/08
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