SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PURPOSE:To improve the detecting rate of defects by outputting the code data on a user program stored in a memory in response to the address signal converted from an input signal of an address and then delivering the arithmetic result of said code data to a general-purpose terminal via a data bus. CONSTITUTION:In a test mode an address input signal 1-a is supplied to a program counter 15 from a general-purpose terminal 11 via an input/output device 12 and a data bus 13. Thus the signal 1-a is converted into an address signal 1-d and supplied to a memory 14 and the code data on a user program corresponding to the relevant address is read out in time division and sent to an ALU 16. Then the code data on plural user programs are calculated by the ALU 16 and the data 1-c on the arithmetic result of the ALU 16 is put on a bus 13. Then the data 1-c is outputted to the terminal 11 via the device 12.