发明名称 SCANNING ELECTRON MICROSCOPE
摘要 PURPOSE:To make such a stable secondary electron image that has no fluctua tion even in case of a high magnification observation against an external field noise and an electromagnetic wave securable by installing a Y-Ba-Cu-O supercon ductor plate in a sample chamber, and also installing a cooler so as to cool this superconductor plate. CONSTITUTION:There are provided with a Y-Ba-Cu-O superconductor plate 7 and a cooler 10, and the inside of the sample chamber of a scanning electron microscope is covered with the superconductor plate 7, cooling this plate 7. That is to say, the Y-Ba-Cu-O superconductor plate is installed in the sample chamber exhaust by a high vacuum of the microscope so as to surround a sample stage, and this plate is cooled by liquid nitrogen and a copper plate, whereby the superconductor plate shows its superconductive characteristic, and owing to its complete diamagnetic character, it completely shields a field noise and an electromagnetic wave, so that even at the time of performing a high magnification image observation at low accelerating voltage, a stable secondary electron image is securable.
申请公布号 JPS6448361(A) 申请公布日期 1989.02.22
申请号 JP19870204644 申请日期 1987.08.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 FUKUOKA YOSHIHIKO;HIOKI YASUHIRO
分类号 G01N23/225;H01J37/16;H01J37/20 主分类号 G01N23/225
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