| 发明名称 |
IC DEVICE AND A SYSTEM FOR TESTING THE SAME |
| 摘要 |
<p>An IC device wherein a source of IC device type-distinguishing data is provided on an IC chip, and a section for drawing out the IC device type-distinguishing data is connected to said source of IC device type-distinguishing data formed on said IC chip.</p> |
| 申请公布号 |
EP0144680(B1) |
申请公布日期 |
1988.12.21 |
| 申请号 |
EP19840112834 |
申请日期 |
1984.10.24 |
| 申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SUZUKI, SOICHI C/O PATENT DIVISION;AIHARA, MITSUO C/O PATENT DIVISION;FUJII, MITSUO C/O PATENT DIVISION |
| 分类号 |
H01L21/822;G01R31/319;G06F11/00;H01L21/02;H01L21/66;H01L23/544;H01L27/04;(IPC1-7):H01L23/54;G01R31/28 |
主分类号 |
H01L21/822 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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