发明名称 DEFICIENCY INSPECTION EQUIPMENT FOR MOUNTED PARTS
摘要 PURPOSE:To prevent a possible mistake with a higher efficiency eliminating the need for a visual teaching, by utilizing information on part mounting positions held with an external device to inspect deficiency of mounted parts. CONSTITUTION:In a preprocessing, data of information on part mounting positions held with an external device is stored in an external memory 11 and information on the size of parts is prepared separately to store data thereof into the same memory 11 or the like. After the completion of the preprocessing, the apparatus is operated to move a measuring table 1 initially from information on a part mounting position read with an arithmetic controller 9 and with the memory 11, and then, a camera 3 and projectors 4a-4d are located corresponding to a prescribed mounting position of a part to be inspected. Then, the controller 9 operates a lifting mechanism 7 and a lens driving mechanism 8 according to information pertaining to the size of the part read from the memory 11 to set a focus and a zoom ratio of the camera 3. After the completion of such an adjustment, the controller 9 operates the camera 3 and the projectors 4a-4d to inspect a positional deviation of the part being inspected.
申请公布号 JPS63308545(A) 申请公布日期 1988.12.15
申请号 JP19860204582 申请日期 1986.08.29
申请人 OMRON TATEISI ELECTRONICS CO 发明人 YAMAGUCHI YOSHINORI;KATO MITSUTAKA
分类号 G01N21/88;G01N21/956;H01L21/06;H05K13/08 主分类号 G01N21/88
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