| 摘要 |
PURPOSE:To realize the rational relief of a defect by providing plural circuit blocks with specified circuit functions, and assigning the respective circuit block to a block address to be designated. CONSTITUTION:The selection of the memory block Mi, in which the defect exists, is prohibited by, for instance, the disconnection of a fusing means, etc. Then, its block address is stored previously in a storage circuit using the fusing means, etc., and when a memory access for the said block address is detected, one memory block is constituted by using four spare memory circuits RM, and a system is established on a wafer by selecting it. Thus, the performance test of the individual circuit block comes possible by the designation of the block address, and the practical isolation of the defective block can be performed by using the block address.
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