发明名称 SEMICONDUCTOR RADIATION DETECTING ELEMENT AND MANUFACTURE THEREOF
摘要 PURPOSE:To etch a fine pattern with excellent reproducibility by etching Si, using an Au film for etching the plane of incidence formed onto a p layer as a mask, shaping a conductor film consisting of Au, etc., to a shape that the conductor film crosses over a stepped section formed near a boundary between the p layer and the plane of incidence and forming an Au film so as to coat the whole plate of incidence. CONSTITUTION:An Au film for etching a radiation incident plane is shaped into a P region in an element. The element previously has an i region 1, a p layer 2, a gate section (part of i region) 3, an n<+> section 4 and an n<+> electrode 5 under the state. The element is mounted to a jig 6 prior to the formation of the film, and a mask 7 coating the plane of incidence is set. An Au film is evaporated and formed onto the surface of the p layer 2 by using the mask. Acid-proof wax 9 is applied onto the p layer 2 and the surface of the n<+> electrode 5 as the pretreatment of etching. The plane of incidence is retreated to the inside through etching, and a stepped section 10 is shaped between the p layer 2 and the i region 1. Wax is removed, and an Au film is evaporated at the stepped section 10 generated through etching. An Au film 13 in the i region 1 is evaporated from the p layer 2 including the whole radiation incident-plane surface, thus forming a Schottky barrier between the Au film 13 and the i region 1.
申请公布号 JPS63244886(A) 申请公布日期 1988.10.12
申请号 JP19870078867 申请日期 1987.03.31
申请人 SHIMADZU CORP 发明人 SAWADA RYOICHI
分类号 G01T1/24;H01L31/00;H01L31/09 主分类号 G01T1/24
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