发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To simplify the steps of oxidizing a filed in an isolation of elements by simultaneously forming a field oxide film and a gate insulating film. CONSTITUTION:A thin thermal nitride film 2 is formed on a semiconductor substrate 1, and the nitride film of a part which becomes a field oxide film region in future is selectively removed by etching. Then, with the film 2 as an oxide mask the substrate 1 is wet oxidized, and a thermal nitride oxide film 9 as a gate insulating film and a field oxide film 3 are simultaneously formed. Thus, the manufacturing steps of an MIS semiconductor device can be shortened.
申请公布号 JPS63237568(A) 申请公布日期 1988.10.04
申请号 JP19870072351 申请日期 1987.03.26
申请人 SEIKO INSTR & ELECTRONICS LTD 发明人 ISHII KAZUTOSHI;NAKANISHI AKISHIGE
分类号 H01L21/316;H01L21/336;H01L29/78 主分类号 H01L21/316
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