发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To simplify the steps of oxidizing a filed in an isolation of elements by simultaneously forming a field oxide film and a gate insulating film. CONSTITUTION:A thin thermal nitride film 2 is formed on a semiconductor substrate 1, and the nitride film of a part which becomes a field oxide film region in future is selectively removed by etching. Then, with the film 2 as an oxide mask the substrate 1 is wet oxidized, and a thermal nitride oxide film 9 as a gate insulating film and a field oxide film 3 are simultaneously formed. Thus, the manufacturing steps of an MIS semiconductor device can be shortened.
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申请公布号 |
JPS63237568(A) |
申请公布日期 |
1988.10.04 |
申请号 |
JP19870072351 |
申请日期 |
1987.03.26 |
申请人 |
SEIKO INSTR & ELECTRONICS LTD |
发明人 |
ISHII KAZUTOSHI;NAKANISHI AKISHIGE |
分类号 |
H01L21/316;H01L21/336;H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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