发明名称 LAVER EXAMINATION APPARATUS
摘要 PURPOSE:To detect the longitudinal cracklings of a laver sheet, by dividing the bit data in a lateral direction into a plurality of bit data groups to detect the hole bit in the bit groups and making the counter corresponding to the bit group having the hole incremental. CONSTITUTION:A feed part 1, an image pickup part 2, a processing part 3 and a change-over part 4 are provided and the central part of the lower follower pulley 9 on the side of the image pickup part 2 is made thin while the central part of the upper follower pulley 9 on the side of the image pickup side 2 is made thick. In the image pickup part 2, fed lever 5 is illuminated by a lamp 11 and the serial image obtained by a line sensor 12 is supplied to the processing part 3 where the image subjected to the serial/parallel conversion is processed in the processing part 3 to be sent to a judge circuit 4. At each time when a hole bit is found, each counter is made incremental to store the length of a vertical hole and the vertical hole exceeding a predetermined length is detected to guide the laver 5 to an inferior product stock part 7.
申请公布号 JPS63225155(A) 申请公布日期 1988.09.20
申请号 JP19870057942 申请日期 1987.03.14
申请人 OMRON TATEISI ELECTRONICS CO 发明人 MIYAZAKI KYOJI
分类号 G01N21/88;A23L17/60;G01N21/89 主分类号 G01N21/88
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