发明名称 PERPENDICULARITY DETECTOR FOR VERTICAL PROBE
摘要 PURPOSE:To automatically detect the perpendicularity of a vertical probe with respect to an object to be inspected in a liquid tank in a short time and with a high accuracy by arranging auxiliary probes in parallel on straight lines orthogonally intersecting with each other at the center of the vertical probe and in symmetrical positions on both sides of the center of the vertical probe. CONSTITUTION:The flaw detecting surface 11a of an object 11 to be inspected is opposed to a probe holder 1 and a vertical probe 2 is mounted to the probe holder 1. Auxiliary probes 3a and 3b are arranged in parallel on a straight line including the vertical probe 2 and in symmetrical positions on both sides of the probe 2. Other auxiliary probes 4a and 4b are arranged on another straight line orthogonally intersecting with above-mentioned straight line at the center of the vertical probe 2 and in symmetrical positions on both sides of the probe 2. The probe holder 1 provided with those probes is rotatably driven around the straight lines taken as rotational axes by Y and Z axis driving units 5 and 6, respectively, until the reflectances of sound pressure from the flaw detecting surface 11a received by the auxiliary probes 3a and 3b; 4a and 4b become equal to each other.
申请公布号 JPS63215965(A) 申请公布日期 1988.09.08
申请号 JP19870047648 申请日期 1987.03.04
申请人 HITACHI CONSTR MACH CO LTD 发明人 MINAMIYAMA EIJI
分类号 G01N29/04 主分类号 G01N29/04
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