发明名称 LEAK RESISTANCE MEASURING METHOD
摘要 PURPOSE:To measure the leak resistance of a liquid crystal even when an electric element has a multilayered insulating film by applying a voltage to the electric element, and then ceasing the application of the voltage to the element and detecting the rising state of a voltage developed across the element. CONSTITUTION:There is the insulating film (light distribution film 2) contiguously to a crystal layer 1, and terminals 5 and 6 are connected to respective electrodes 3 and 4 and led out. A voltage source 13, a means 11 which switches it, and a means which observes the voltage v0 between the terminals 5 and 6 of the element are provided ass a means which measures leak resistance. The voltage is applied across the display element by the voltage source 13 and switch 11 for a certain period and then while the switch 11 is open, a waveform v0 is observed by a means which makes an observation to obtain a waveform v2, thereby finding the leak resistance from information on the waveform.
申请公布号 JPS63214672(A) 申请公布日期 1988.09.07
申请号 JP19870047568 申请日期 1987.03.04
申请人 HITACHI LTD 发明人 SUZUKI MASAYOSHI;KITAJIMA MASAAKI;OWADA JUNICHI;TAKAHATA MASARU;FUNAHATA KAZUYUKI
分类号 G01R27/02;G02F1/13 主分类号 G01R27/02
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