| 摘要 |
PURPOSE:To execute a high accurate test by rearranging converted data stored into a memory, converting them to the data column of one wave's share in which a phase is zero, executing a discrete Fourier transform based on a determined data scope, obtaining the phase and amplitude of an ideal sine wave signal, and obtaining the error with the converting data. CONSTITUTION:From a high purity sine wave generator 1 to a measuring object A/D-converter 2, a sine wave signal is supplied in which the converting data outputted from the measuring objet A/D-converter 2 are saturated and the converting data are stored into a memory 3. After the converting data stored into the memory 3 are rearranged, they are converted to the data column of one wave's share in which the phase is zero based on the already-known direct current component, the data scope of the saturated part is obtained from the data column of one wave's share and the data scope to obtain an ideal sine wave signal is determined. After that, by executing the discrete Fourier transform based on the determined data scope, the phase and amplitude of the ideal sine wave signal equivalent to an input signal are obtained, and the error with these ideal sine wave signal data and the converting data is obtained.
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