| 摘要 |
The tester consists of (a) a connection card (24) for connection to each of the terminals of the circuit to be tested; (b) n cards (16), termed electronic pins, incorporating means for shaping signals, each of the cards being connected to an input of the connection card; (c) a single memory module (17) for storing test vectors, containing all the test vectors destined for the circuit and expected from it, the vectors passing through the said electronic pins; (d) a central processing unit (10) to manage the system and provide the external links. The memory storing the vectors is managed concurrently by a memory management unit (22) connected independently from the other modules of the tester to the central processing unit (10). An address processor (23) operates asynchronously with respect to the central processing unit.
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