| 摘要 |
PURPOSE:To make the title measuring apparatus inexpensive, by arranging a wide-band 1/4 wavelength plate between a polarized beam measuring device part and a spectroscope partin the azimuth of 45 deg. with respect to a polarizing direction in integral relation to the detector of the polarized beam measuring device part. CONSTITUTION:A polarized beam spectral measuring apparatus is constituted by arranging a polarized beam measuring device part 1 and a spectroscope part 2 between a beam source L and a diffraction lattice G. Herein, the measuring device part 1 is constituted of a polarizer p, a compensator C, a specimen 3 and a holder 4, and a detector A and a polarized beam eliminator are usually provided in the holder 4 but no inexpensive eliminator is used at this time and, in place of said eliminator, an inexpensive wide-band 1/4 wavelength plate BC is provided. Further, the incident slit S positioned on an optical axis and the sensor D receiving the beam from the diffraction lattice G are provided to the spectroscope part 2. In this constitution, the compensator C is fixed at an angle of 45 deg. with respect to the optical axis and the polarizer P is rotated to obtain oval polarized beam through the compensator C and said polarized beam is allowed to be incident to the specimen 3. The wavelength plate BC is rotated in integral relation to the detector A and converts the beam incident to the spectroscope part 2 to circular polarized beam.
|
